| In the process of validation of crimped connec-tions, the determination of the connector resistance factor and of the initial scatter coefficient has a decisive role. In this paper is studied the impact of the experimental meas-urements accuracy on the calculation of initial scatter, cu-mulating data from various types of crimped connections. This coefficient provides information on the behavior of the crimped connection immediately after installation before any aging effect begins. The standards establish that 6 sam-ples are sufficient to be tested to estimate the identification of a “family” of connectors. The measurements were per-formed on crimped connections of barrel of terminal lug type for three cross sections of cables and on crimped con-nections of bimetallic through connector type for two pairs of cross sections. The initial scatter is influenced by 6 repre-sentative measured quantities as voltage drops, currents and conductor lengths. First, it was imposed a variation by one unit of hundredths digit of initial scatter and was recorded the variation of each quantity, the others 5 quantities being kept constant. Then simultaneous variations of the 6 quanti-ties caused by device reading errors were imposed, deter-mining the quantities with the greatest influence on initial scatter. Useful recommendations for experimenter are made. |
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